DE-DN
A Semiconductor Defect Notice and Management System
DE-DN
The semiconductor defect notice and management system (DE-DN) is designed to monitor, detect, track, and manage various defects in real-time during IC manufacturing processes. With rich experience in defect case analysis, we integrate advanced detection technologies and data analysis and collaboration platforms to achieve the recording, tracking, and summarization of defect cases. This provides engineers with a comprehensive solution for defect analysis and helps enterprises enhance yield, reduce costs, and accelerate response to problems.
Features
DN Management
Flexible and user-friendly DN Search;
Automated retrieval of defect information;
Automated analysis of defect topographic information, including Defect Map and Defect Image;
Automated correlation with WIP data, Lot History, E-Log, etc.;
A sign-off system with flexible processes and clear access control;
DN Summarization
Real-time integration and dynamic monitoring of case data, data integration across platforms, and the establishment of a unified data pool;
Multi-dimensional aggregation analysis and a global perspective to provide product-line traceability analysis and root cause analysis;
A knowledge based-decision-making system with integration of structured knowledge repositories and LLM reasoning;
